Project6.pptVIP

Majority Voting circuit (Continue) 05/14/2014 8 Simulation Result of Majority Voting Circuit 05/14/2014 9 PC_OUTVOTE_OUT10111011 111111 00 Beat Frequency Detector 05/14/2014 10 Simulation Result of Beat Frequency Detector Circuit 05/14/2014 11 Beat Frequency Latency 10111 011 111111 00 8 Bit Counter Circuit 05/14/2014 12 Simulation Result of 8 Bit Counter 05/14/2014 13 Simulation Result of Total Circuit 05/14/2014 14 15 CONCLUSION 05/14/2014 16 05/14/2014 THANK YOU! Yaman Yaman Yaman Yaman Yaman Yaman Yaman Yaman Yaman Yaman Yaman Yaman On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits Department of Electrical and Computer Engineering By Han Lin Jiun-Yi Lin 05/14/2014 Overview Introduction Principle and background Proposed reliability monitor circuit Circuit Blocks and Simulation Result: Ring Oscillator Phase Comparator Majority Voting Circuit Beat Frequency Detector 8 Bit Counter Circuit Total Circuit Conclusion 05/14/2014 1 Abstract Precise measurement of digital circuit degradation caused by aging Reliability monitor using beat frequency of two ring oscillators to get a high sensing resolution 1V, 32nm CMOS technology, up to 0.02% sensing resolution Overview Introduction Principle and background Proposed reliability monitor circuit Circuit Blocks and Simulation Result: Ring Oscillator Phase Comparator Majority Voting Circuit Beat Frequency Detector 8 Bit Counter Circuit Total Circuit Conclusion 05/14/2014 1 Types of reliability issues BTI (bias temperature instability) HCI (hot carrier injection) TDDB (time-dependent dielectric breakdown) NBTI (negative bias temperature instability) NBTI effect is among the most pressing issues among all of them Cause of NBTI effect Structural mismatch at the Si-SiO2 interface cause dangling bonds Si-H bonds is transformed by hydrogen passivation process of dangling Si bonds which is made by oxidation of Si-SiO2 Broken bonds from Si-H degrade the driving curre