SmarterSamplePreparationMethodtoimprove-Buehler.PDFVIP

Smarter Sample Preparation Method to improve Quality Control Efficiency in Electronic Industry Benny Leung, Buehler Asia-Pacific Excellent Results. Easily Repeatable.™ Introduction When the cross section must be conducted through a specific area or level in the sample, targeted micro-sectioning for microscope examination of samples is required. This is most often These conventional methods have been used for many years; but done in the electronics industry for failure analysis and quality they still have several limitations: control, but also for research and production control purposes. 1. Low sample throughput Because the level of the feature(s) of interest varies from sample 2. Inconsistency in results due to difference behavior of to sample, normally only one sample can be done at a time so the operators targeted micro-sectioning is done by hand. If the samples 3. Cross-contamination due to the dry-out of the alumina on surfaces are flat enough or the features to be hit are on the the polishing cloth similar plane, it is also possible to use an advanced 4. Smear which may hide features; e.g. micro-cracks, micro-sectioning system which is able to handle multiple samples intermetallics, lagers or delamination in high volume. As an example, Buehler PWB-Met system is 5. Relief problem from excessive polishing time and the use of designed to ser