高频信号传输特性与电路量测.pptVIP

RF (Gigahertz) ATE Production Testing on Wafer: Options and Tradeoffs Presented by Dean A Gahagan Marketing Manager Pyramid Probe Division Cascade Microtech, Inc Purpose Purpose is to describe practical HW options for production on-wafer RF test and to compare these options with respect to RF Performance and Production worthiness Outline Why RF test on-wafer? Typical RF and IF measurements required on a RF device Production RF testers available Tester to probe card Interfaces Probe cards Calibration Probe stations Conclusion Typical ATE Wafer probing Configuration Tester Docking Head Probe C