Top View Inspection System AIO MARQ-XP 2维顶视记检测.pptVIP

Vistech Corporation AIO MARQ-XP 2D Top View Inspection System AIO MARQ-XP 2维顶视记检测系统 Leaders in Vision Inspection Solutions for Integrated-Circuit Devices Since 1991 ! 创建于 1991, 卓越的半导体集成芯片检测方案 ! This is standalone vision system. This system includes Desktop PC with vision processor, Keyboard, Camera and mounting mechanical parts, I/O cable. 这是个独立的视觉检测系统. 系统包括: 装有视觉处理器的台式计算机, 键盘, 像机, 安装像机的机械装置, 输入/输出电缆线. Standalone Vision Processor in Desktop PC Case. 独立的视觉处理器放入个人计算机机箱中. Inspect top view marking (Optional Upgrade to lead, orientation, surface, and dambar inspection). 检测顶视印记的质量 (可选择升级到: 管脚,方向识别, 表面,及dambar检测). Wide Range of Integrated-Circuit Devices Solution: 应用于多种半导体集成电路芯片: BGA, DFM/DFS, DPAK, LLP, MLF, PDIP, QFN, QFP, SMA, SMB, SMC, SOIC, SOJ, SOT, TO etc. Note: Lead inspection is only for SOIC, SOT devices. Dambar inspection is only for SOIC devices. 注解: 管脚检测只适用于 SOIC, SOT器件 Dambar 检测只适用于 SOIC器件. Reliable: Low Overkill Rate: 0.2%. 性能可靠: 超低的误判率: 0.2%. Fast: PPH 30,000. Based on options. 快速: 每小时检测的器件 30,000. 基于不同选项. Flexible, Simple, Easy to Use. 使用灵活, 简单, 方便. PC 计算机 TR:Mark 封装 :印记 Monitor 显示器 Keyboard 键盘 Mouse 鼠标 Optional: Lead, Orientation, Surface, Dambar 可选择升级 : 管脚, 方向, 表面, Dambar Scratch 划痕 AB12 AF12 A 12 AB12 AB 12 A 12 AB12 AB12 AB12 AB12 AB12 Good Unit 良品 Mixed 混料 Missing 无印记 Missing Character 漏印字符 Orientation 印记反向 Broken Character 字符破损 Character Alignment 字符偏移 B Double Mark 重复印记 AB12 Contrast 字符对比度低 Position 字符位置 偏移 Angle 字符角度错 . Extra Mark/ Debris 多余印记／玷污 Marking Detectable Defects　　印记可检测的缺陷 AIO MARQ-XP 2D Top View Inspection System AIO MARQ-XP 2维顶视记检测系统 2D Top View Lead Measurements (Optional upgrade) (SOIC, SOT Only) 2维顶视管脚测量项目 (可选择升级) (只适用于 SOIC, SOT) Width 宽度 Pitch 间距 Offset 偏移 Skew 歪斜 Length Variance 管脚长偏差 Length 长度 Span 跨距 Lead Slant 管脚倾斜 Topview Dambar Capability (Optional upgrade) (SOIC Only) 　 顶视图 Dambar 检测功能 (可选择升级) (只适用于 SOIC) Dambar Lea