a d v a n c e s i n m e a s u r e m e n t s o f p h y s i c a l p a r（因为这是一件值得的事，所以我们应该有一个机会。）.doc

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a d v a n c e s i n m e a s u r e m e n t s o f p h y s i c a l p a r（因为这是一件值得的事，所以我们应该有一个机会。）.doc

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a d v a n c e s i n m e a s u r e m e n t s o f p h y s i c a l p a r（因为这是一件值得的事，所以我们应该有一个机会。）

Advances in measurements of physical parameters of semiconductor lasers G. E. Shtengel Lucent Technologies Bell Laboratories, 9999 Hamilton Blvd., Breinigsville, PA 18031 USA G. L. Belenky Department of Electrical Engineering, SUNY at Stony Brook, Stony Brook, NY 11794 USA Lucent Technologies Bell Laboratories, 700 Mountain Ave., Murray Hill, NJ 07974 USA M. S. Hybertsen Lucent Technologies Bell Laboratories, 700 Mountain Ave., Murray Hill, NJ 07974 USA R. F. Kazarinov Lucent Technologies Bell Laboratories, 9999 Hamilton Blvd., Breinigsville, PA 18031 USA D. A. Ackerman Lucent Technologies Bell Laboratories, 700 Mountain Ave., Murray Hill, NJ 07974 USA We present a summary of advances in characterization techniques allowing for comprehensive study of physical processes in semiconductor lasers. Outline .Begin Table C. 1. Introduction. 2. Measurements of the optical gain. 2.1. Determination of the optical gain from the amplified spontaneous emission. 2.2. Determination of the optical gain from the true spontaneous emission. 2.3. Determination of the gain in broad-area lasers. 3. Measurement of the optical loss. 4. Measurement of the carrier leakage in semiconductor heterolasers. 4.1. Optical technique of studying the carrier leakage. 4.2. Electrical technique of studying the carrier leakage. 5. Electrical and optical measurements of RF modulation response below threshold. 5.1. Determination of the differential carrier lifetime from the device impedance. 5.2. Determination of the differential carrier lifetime from the optical response measurements. 6. Optical measurements of RF modulation response and RIN above threshold 6.1. Determination of the resonant frequency and damping factor using carrier subtraction technique. Determination of the differential gain and the gain compression coefficient. 6.2. Determination of the resonant frequency and differential gain from the RIN measurements. 7. Measurements of the linewidth enhancement factor. 7.1. Measuremen