previously,wereportedonthegainvariationpossiblydueto（此前，wereportedonthegainvariationpossiblydueto）.docVIP

DEUKHEP02-11-08 Gain Variation Due to Wire Quality-SEM study Bill Ebenstein, Jack Fowler, Seog Oh, Chiho Wang Department of Physics Duke University, Durham, NC. 27708 Previously, we reported on the gain variation possibly due to the wire quality. This preliminary conclusion was based on the observed correlation between the degree of the gain variation and the Toshiba spool number. We also pointed out that wire from one Toshiba spool does not appear in both the low gain and high gain variation straws. We speculated that some type of wire quality, including damage, could produce the observed gain variation. In order to check this, we pulled out wires from two channels (Straw number 654 and 655) from Module 3.06. The gain maps of the two wires are shown in Figure 1 and Figure 2. Only the front half is investigated. From two wires, five regions were chosen for the SEM analysis. From the five regions, fourteen wire segments with length ~1 cm were cut. Table 1 below shows the region and number of segments from each region. In the gain measurement, x in Figure 1 and 2 is along the straw length and the distance between each measurement is exactly 2.54 cm. However the absolute x distance from the wire-joint (our reference point for cutting segments) is not known within a few mm. Thus we believe the accuracy of our cutting is about 0.5 cm including the cutting error with respect to the wire-joint. We should also note that the X-ray beam width for the measurement is about 0.75 cm at the straw location. Region Identification Number of Segments Straw 655, x~4 2 Straw 655, x~9 2 Straw 655, x~15 to x~17 6 Straw 655, x~21 2 Straw 654, x~22 2 Table 1. The identification of the region and number of wire segments per region for the SEM analysis. Each segment is ~ 1cm long. Figure 1. The front section gain map of the Straw 654. The sections of wire removed for SEM scanning is x~22. For the SEM scanning, we removed ~1 cm wire length