Traceprostarylight解读.ppt

Complete the Telescope Importance Sampling Define importance sampling for the primary and secondary mirrors. Determine the optimal location of the importance sampling target for the primary: Set the half angle of the beam to zero and trace a y fan of rays using the Grid Raytrace dialog box. Exclude the secondary mirror and support struts from the ray-trace using the Apply Properties dialog box, Raytrace Flag tab. Using the Grid Raytrace dialog box, Beam Setup tab, select Beam orientation method: Euler angles (degrees). Enter (-0.25, 0, 0) for the Direction angles. The point where these rays come to a focus is the edge of the importance sampling target. Measure this point with the mouse: (0, 1.75, -105). Place the importance sampling target at (0, 0, -105). The rays do not come to a sharp focus because of the aberrations of the primary mirror, so make the target a little oversize, or about 2. The ray-trace is shown below. 利用以上TracePro的各項功能，即可很快速的分析出雜散光所需分析的Ghost，Straight shot，single scatter，muti-scatter的分析項目。 结论 参考文献 General Stray Light Proc. SPIE vol. 107, Stray-Light Problems in Optical Systems (1977). Proc. SPIE vol. 257, Radiation Scattering in Optical Systems (1980). Proc. SPIE vol. 384, Generation, Measurement, and Control of Stray Radiation III (1983). Proc. SPIE vol. 511, Stray Radiation IV (1984). Proc. SPIE vol. 675, Stray Radiation V (1986). Proc. SPIE vol. 967, Stray Light and Contamination in Optical Systems (1988). Proc. SPIE vol. 1331, Stray Radiation in Optical Systems (1990). Proc. SPIE vol. 1753, Stray Radiation in Optical Systems II (1992). Proc. SPIE vol. 2260, Stray Radiation in Optical Systems III (1994). Radiometry The Infrared Electro-Optical Systems Handbook, Volume 1: Sources of Radiation, Chapter 1, Radiation Theory, W.L. Wolfe, ERIM/SPIE Press, Bellingham, WA (1993). Selected Papers on Radiometry, SPIE Milestone Series Vol. MS 14, SPIE Press (1990). 参考文献 General Scattering M. Nieto-Vesperinas, Scattering and Diffraction in Physical Opti