-连接器测试概要.pptVIP

參考標准 EIA 美國電子工業協會標准 MIL-STD 美軍標准 JIS 日本工業標准 EIA-364-D ELECTRONICS INDUSTRIES ASSOCIATION ---ELECTRICAL CONNECTOR TEST PROCEDURE ● EIA 是美國電子工業協會的簡稱,對電子產品訂定各種標准,做為制造商及采購者對產品交換性及引進提供一有效橋梁,如此,可協助采購者在產品特定要求下,做出一正確選擇,而EIA-364-D系列為一電子連接器及插座測試程序/測試方法總覽. ● EIA-364系列已成為電子連接器國際間最普遍接受之規范,期望會員對此皆有一概 括了解,作為提升連接器水准之基本依據. 接觸電阻測試程序 絕緣電阻測試原理 耐電壓測試原理 * * 產品資格測試( Product Qualification Test ) 主講人: 實驗室 張劍波 產品資格測試 產品資格測試 產品資格測試 按測試性質可分為三類: 電氣性能 機械性能 環境性能 電氣性能 (Electrical Performance ) EIA 364-70 Method B When measured at an ambient temperature of 25℃. With Power applied to the contacts, the ΔT shall not exceed + applied to the contacts, the 30℃ at any point in the USB connector under test Contact Current Rating 溫升 [Temperature Rising ] EIA 364-30 Test between adjacent circuits of unmated connector at 1 KHz. Contact Capacitance 電容 EIA 364-20 (or MIL-STD-202F, Method 301, Test Condition B) Test between adjacent contacts of mated and unmated connector assemblies. Dielectric Withstanding Voltage [ DWV ] 耐電壓 EIA 364-21 (or MIL-STD-202F, Method 302, Test Condition B) Test between adjacent contacts of mated and unmated connector assemblies. Insulation Resistance [ IR ] 絕緣電阻 EIA 364-23 (or MIL-STD-1344A, Method 3002.1, Test Condition B) Subject mated contacts assembled in housing to 20mV maximum open circuit at 100 mA maximum Low Level Contact Resistance[ LLCR ] 接觸電阻 Test Methods Test Description 機械性能 (Mechanical Performance ) EIA 364-13 Shall be measured with TENSION GAUGE or TENSION TESTER. Measure force necessary to mate assemblies at maximum rate of 12.5mm (or 0.492”) per minute. Connector Unmating Force [ 拔出力 ] EIA 364-13 Shall be measured with TENSION GAUGE or TENSION TESTER. Measure force necessary to mate assemblies at maximum rate of 12.5mm (or 0.492”) per minute. Connector Mating Force [ 插入力 ] EIA 364-09 Mate and unmate Connector assemblies for 5000 cycles at maximum rated of 200 cycles per hour.