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Swinburne University of Technology Faculty of Engineering and Industrial Sciences Integrated Circuit design Tutorial 4 Q1 Fault Modeling Consider a combinational circuit given in Fig 1 below. Note this circuit has a total of 13 fault sites including the faults at the inputs and output lines. (a) How many checkpoints does this circuit have? 8 check points. six PIs and e1 and e2. (b) List all single stuck-at faults that are equivalent to the fault at line g3 stuck-at 0. g1/1, g2/1, F/1, e2/0, e1/0, D/0, C/0 (c) Using structural analysis only, identify all single stuck-at faults that are dominated by the fault at output Z stuck-at 1. g4/1, A/1, g3/1, B/1 Q2. Fault Simulation - Deductive For the circuit given in Figure 2 the faults of interest are: {A/0, A/1, B/0, E/1, 14/1, 19/1, 20/1, 21/1, 22/1, 24/1 }. Fig 2 You are to perform deductive fault simulation for this circuit for the test pattern A B C D E = 1 1 0 0 0. (a) Associate a list with every line in the table below as a deductive fault simulator will. First few entries have completed. Note that only those faults should be included in the lists that appear in the set above. (b) List the faults that are detected by the above test vector: E/1, A/0 Q3. Combinational Test Generation - Boolean Difference For the circuit given in Fig 3 find all possible tests to that will detect the fault B stuck-at 1. Use of Boolean difference and basic D algorithm Fig 3 Using D algorithm (A B C d e f g h Z1 Z2) Pdcf (X 0 1 X D X X X X X ) Propagare (X 0 1 1 D D 1 D D’ D’ ) Consistency (X 0 1 1 D D 1 D D’ D’ ) Test X 0 1 for A B C Q4. BIST Consider the following characteristic polynomial given below and answer each of the following questions. F(x) = x5 + x2 + 1 Give the standard (external EOR) LFSR realization of this polynomial. Give the modular (internal EOR) LFSR realization of this polynomial. (c) The internal LFSR based on the above polynomial is used to compute the signature of the input