ESE680-002(ESE534)ComputerOrganization.pptVIP

ESE680-002 (ESE534):Computer Organization;Today;Warmup Discussion;Motivation: Probabilities;Probabilities;Simple Implications;Defining Problems;Three “problems”;Defects;Faults;Lifetime Variation;;Defect Rate;First Step to Recover;Detection;Detection;Coping with defects/faults?;Defect Tolerance;Two Models;Disk Drives;Memory Chips;Example: Memory;Memory Defect Tolerance;Memory Techniques;Row Redundancy;Spare Row;Column Redundancy;Spare Memory Column;Block Redundancy;Spare Block;Yield M of N;M of 5 example;Repairable Area;Repairable Area;Consider a Crossbar;Crossbar Buses and Defects;Crossbar Bu