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Improving the Fault Tolerance of a Computer System with Space-Time Triple Modular Redundanc.pdf

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Improving the Fault Tolerance of a Computer System with Space-Time Triple Modular Redundanc

Improving the Fault Tolerance of a Computer System with Space-Time Triple Modular Redundancy Wei Chen, Rui Gong, Fang Liu, Kui Dai, Zhiying Wang School of Computer, National University of Defense Technology, Changsha 410073, Hunan, China {chenwei, gongrui, liufang, daikui}@; zywang@ Abstract - Triple Modular Redundancy is widely used in dependable systems design to ensure high reliability against soft errors. Conventional TMR is effective in protecting sequential circuits but can’t mask soft errors in combinational circuits. A new redundancy technique called the Space-Time Triple Modular Redundancy is presented in this paper, which improves the soft error tolerance of the combinational circuit. This paper demonstrates the usefulness of the Space-Time Triple Modular Redundancy design in a special case study. The delay overhead and the fault tolerance of Space-Time Triple Modular Redundancy are compared with that of the conventional Triple Modular Redundancy. Results show that Space-Time Triple Modular Redundancy is more effective than the conventional Triple Modular Redundancy. Keywords: soft error, fault tolerance, reliability, space- time triple modular redundancy, sequential circuit, combinational circuit. 1 Introduction Integrated Circuits (IC) used in computer systems and other electronic systems operating under radiation are susceptible to a phenomenon known as Single Event Upset (SEU), or soft error. A soft error is a transient effect induced by the trespassing of a single charged particle through the silicon. Due to the constant shrink in the transistor dimensions, particles that once were considered negligible now are significant to cause upsets [1] which can perturb the integrated circuit operation. As computer systems and other electronic systems are widely used in radiation environments such as space vehicles, satellites and some military systems, fault tolerance and reliability of the IC should be improved to