FPGA中宽边译码器的测试方法研究 .pdfVIP

学兔兔 第3l卷 第7期 仪 器 仪 表 学 报 VoL 31 No．7 2010年7月 Chinese Journal of Scientific Instrument Ju1．2010 FPGA中宽边译码器的测试方法研究 廖永波，李 平，阮爱武，李文昌，李 威 (电子科技大学电子薄膜与集成器件国家重点实验室 成都 610054) 摘 要：现有的关于FPGA的测试主要集中在可编程逻辑和互连线资源，而没有涉及FPGA中的宽边译码器的测试。本文提出 了一种测试FPGA中宽边译码器的方法，该方法实现了FPGA中的宽边译码器的逻辑资源及其相连的长线资源的全覆盖测试。 该实验采用Xilinx公司的XC4000E系列芯片，在基于SOC软硬件协同技术的FPGA自动测试系统中进行测试。实验结果表 明，用本文提出的4次配置图形和测试向量能够完成全覆盖测试。 关键词：FPGA；宽边译码器；测试方法；配置图形；测试向量 中图分类号：TP206 ．1 文献标识码：A 国家标准学科分类代码：510．3040 Test scheme for wide edge decoder in FPGA Liao Yongbo，Li Ping，Ruan Aiwu，Li Wenchang，Li Wei (State Key Laboratory ofElectronic Films and Integrated Devices，University ofElectronic Science and Technology ofChina，Chengdu 610054，China) Abstract：The test of programmable logics and interconnect resources in FPGA has always been the research focus． However．the test of wide edge decoder in FPGA has seldom been studied．A test scheme for wide edge decoder iS presented in this paper．In the test scheme，the full—coverage test of wide edge decoder with its associated long line resource iS implemented．The test scheme has alSO been verified with an experiment．An in．house developed FPGA test system based on SOC hardware／software verification technology is applied to XCA000E family from Xilinx．Ex— perimental results demonstrate that the wide edge decoder with its associated long line resource can be fully tested with the proposed 4 test patterns and test vectors． Key words：FPGA；wide edge decoder；test scheme；configuration pattern；test vector