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集成电路可测性设计之概述
Fundamentals on Testing and Design for Testability Design Verification, Testing and Diagnosis Design Verification: Ascertain the design perform its specified behavior Testing: Exercise the system and analyze the response to ascertain whether it behaves correctly Diagnosis: To locate the cause of misbehavior after the incorrect behavior is detected Some Real Defects in Chips Processing Faults missing contact windows parasitic transistors oxide breakdown Material Defects bulk defects (cracks, crystal imperfections) surface impurities (ion migration) Time-Dependent Failures dielectric breakdown
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