南京理工大学MordenPowerElectricity课程英文综述.docVIP

The?Literature?Review?? of Failure Characteristic Parameters Extraction of Power Device in Power Electronic Circuit 指导老师：江宁强 学生姓名:于杏 学生号：115108000887 日期：2016.01.11 ABSTRACT：Main power device is the core part of power electronic circuits .It’s fault feature extraction is the foundation of fault diagnosis and forecast in power electronic circuits ,which is quiet useful to the reliability .The article introduces the reliability distribution of main power devices,and emphatically analyses Failure Mechanism and declining of MOSFET and IGBT.And also make a classification of parameter fault feature extraction methods:Direct Extraction and Indirect Extraction.What’s more,there are introductions of different extraction methods.In the end ,the article poins out its research difficulties and direction. KEY WORDS:fault feature extraction; reliability; Failure Mechanism; power electronic; power switch device. INTRODUCTION: Because of its advantages of low noise, high efficiency, high power density, morden power electronic circuits is widely used in industry, military, aerospace and other fields[1].Take an important role in the circuit transformation, new energy power generation.With the increasingly complicated power electronic circuits, power level continuously high,Especially when used in some important fields such as aviation, aerospace, Higher request to the reliability of the power electronic circuit. With the further study of the principle of the power device failure, and the continuous development of sensor technology and signal detection technology, it is possible to realize fault diagnosis of power electronic devices, failure prediction and state prison test [2]. What’s more, choosing appropriate fault characteristic parameters and the corresponding fault fea