胡志文-2016.07.25.pptVIP

Problems of Mutation Testing and Higher Order Mutation Testing Quang Vu Nguyen, Lech MadeyskiInstitute of Informatics, Wroclaw University of Technology, WybrzezeWyspianskiego 27,50370 Wroclaw, Poland Advances in Intelligent Systems Computing, 2014, 282:157-172,?2014,?282:157-172 2016 summer paper reading plan of SBSE HU ZHIWEN 2016,07,26 Abstract Since Mutation Testing was proposed in the 1970s, it has been considered as an effective technique of software testing process for evaluating the quality of the test data. In other words, Mutation Testing is used to evaluate the fault detection capability of the test data by inserting errors into the original program to generate mutations, and after then check whether tests are good enough to detect them. However, the problems of mutation testing such as a large number of generated mutants or the existence of equivalent mutants, are really big barriers for applying mutation testing. A lot of solutions have been proposed to solve that problems. A new form of Mutation Testing, Higher Order Mutation Testing, was first proposed by Harman and Jia in 2009 and is one of the most promising solutions. In this paper, we consider the main limitations of Mutation Testing and previous proposed solutions to solve that problems. This paper also refers to the development of Higher Order Mutation Testing and reviews the methods for finding the good Higher Order Mutants. Introduction error is a human action that produces an incorrect result, faultis an incorrect step, process, or data definition in a computer program and failure is the inability of a system or component to perform its required functions within specified performance requirements. Mutation Testing (MT), a technique that has been developed using two basic ideas: Competent Programmer Hypothesis (“programmers write programs that are reasonably close to the desired program”) and Coupling Effect Hypothesis (“detecting simple faults will lead to the detection of more comp