分析固体微结构的方法（Method for analyzing solid microstructures）.docVIP

分析固体微结构的方法（Method for analyzing solid microstructures） Analysis method of solid micro structure and basic principle XRD: working principle: X ray radiation is the inner electrons of the atoms in the high-speed movement electron bombardment transition caused by mainly continuous X ray and X ray characteristic two. The crystal can be used as a X optical grating, coherent interference of light scattering will produce the large number of atoms or ions / molecules, thus affecting the X ray scattering intensity of the increase or decrease. Due to the large number of atomic scattering superposition of wave beam, interference generated maximum strength called ray diffraction X. Meet the diffraction conditions, can be used in Prague formula: X - ray 2dsin theta = lambda application of known wavelength to measure angle, so as to calculate the spacing of D, which is used for X ray structure analysis; the other is the application of known D crystal to measure angle, to calculate the characteristic X ray wave length. It can be found in the sample contained in existing data elements. At present, X ray diffraction (scattering) has become an effective method to study the crystal material and some amorphous material micro structure. Mainly used in metal in the following aspects: 1, phase analysis is X ray diffraction in the metal with the most points, qualitative analysis and quantitative analysis. Determination of solid solubility curve 2, the precise determination of the lattice parameters used in the phase diagram. 3, orientation analysis including structure determination of crystal orientation and polycrystalline (see preferred orientation). The macro residual stress determination of the direction and size of 4, the macro stress, directly affect the service life of machine parts. Study on the crystal structure of 5, including the integrity of stacking fault, dislocation, atomic static or dynamic deviate from the equilibrium position, the short-range order, and other aspects of t