氙灯耐气候试验箱系统工作的基本原理（Basic principle of xenon lamp weather test box system）.docVIP

氙灯耐气候试验箱系统工作的基本原理（Basic principle of xenon lamp weather test box system） Basic principle of xenon lamp weather test box system The xenon lamp weather test box lamp tube is convenient and quick to change. A long acting filter that provides protection for the desired spectrum. In addition to light degradation tests, xenon lamp weather test equipment can also simulate the impact of outdoor moisture on material damage by increasing moisture and water spray options. Moisture is also a major factor in the destruction of some materials. The higher the moisture content, the faster the damage to the material. Humidity can affect the degradation of indoor and outdoor products, such as textiles. This is because when the material tries to maintain a moisture balance between the surrounding environment, the material itself is subjected to an increase in physical stress. Therefore, when the atmospheric humidity range is greater, the overall stress on the material is even greater. The negative effects of humidity on weather resistance and fading resistance of materials have been widely recognized. The wet function of the equipment can simulate the influence of indoor and outdoor moisture on the material. Temperature control of power output by the microcomputer calculation, to increase the accuracy and high efficiency of electricity efficiency. The equipment with external humidification system of boiler steam humidifier with water, automatic compensation, alarm systems, far infrared heating stainless steel high speed electric heating tube, humidity control using P. I. S. R. DS, co channel coordination control system. Due to exposure to fluorescent lamps, halogen lamps, or other lights for a long time, products placed in retail locations, warehouses or other environments will also experience significant photodegradation. Xenon lamp weather test equipment can also simulate the destructive light produced in such commercial lighting environments, and can accelerate the test process at