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mems可变电容的研究现状及进展 status and progress of mems variable capacitors
MEMS器件与技术
MEMS
DeviceTechnology
MEMS可变电容的研究现状及进展
李玲玉1’2,童 富h2,杨月寒1’2,赵建明 刘海文2
(1.电子科技大学电子薄膜与集成器件国家重点实验室,成都610054;
2.中国科学院光电技术研究所微细加工光学技术国家重点实验室,成都 610209)
有高Q值、低损耗、宽调节范围和低噪声等优点,阐述了MEMS可变电容器设计的基本原理,
列举了现有的几种典型结构模型。通过指定频率下Q值及调谐范围的具体数值,比较不同结构
的MEMS可变电容的特点,展望了MEMS可变电容的发展并得出结论。
关键词:平行板可变电容;面积调谐可变电容;微机电系统(MEMS);Q值;调谐范围;射频
中图分类号lTH703;TM532.5
and of
Status MEMSVariable
Progress Capacitors
Li Yuehanl”,Zhao Haiwen2
Lingyul”,TongFul“,Yang Jianmin91,Liu
and
(1.State ElectronicThinFilms Devices,
KeyLaboratoryof Integrated
ElectronicScienceand
of 610054,China;
University TechnologyofChina,Chengdu
2.State
KeyLaboratoryofOpticalTechnologiesforMicrofabrication。InstituteofOpticsElectronics。
Chinese 610209,China)
ofSciences,Chengdu
Academy
basedonthemicro—electronmechanical
Abstract:Variable
capacitors
areintroduced.Thehavethemeritsof and
capacitors Q,lowlOSS,widetuningrange
gY high
lownoise.Thebasic forMEMSvariable is several
design capacitorspresented,and
principle
structureare characteristisofMEMSvariableca—
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