robust affine invariant descriptors健壮的仿射不变量描述符.pdf

Hindawi Publishing Corporation Mathematical Problems in Engineering Volume 2011, Article ID 185303, 15 pages doi:10.1155/2011/185303 Research Article Robust Affine Invariant Descriptors Jianwei Yang,1 Zirun Chen,1 Wen-Sheng Chen,2 and Yunjie Chen1 1 College of Math and Physics, Nanjing University of Information Science and Technology, Nanjing 210044, China 2 College of Mathematics and Computational Science, Shenzhen University, Shenzhen 518060, China Correspondence should be addressed to Jianwei Yang, yjianw2002@ Received 28 January 2011; Accepted 18 February 2011 Academic Editor: Ming Li Copyright q 2011 Jianwei Yang et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. An approach is developed for the extraction of affine invariant descriptors by cutting object into slices. Gray values associated with every pixel in each slice are summed up to construct affine invariant descriptors. As a result, these descriptors are very robust to additive noise. In order to establish slices of correspondence between an object and its affine transformed version, general contour GC of the object is constructed by performing projection along lines with different polar angles. Consequently, affine in-variant division curves are derived. A slice is formed by points fall in the region enclosed by two adjacent division curves. To test and evaluate the proposed method, several experiments have been conducted. Experimental results show that the proposed method is very robust to noise. 1. Introduction Object recognition is an important topic in the area of computer vision and has been found numerous applications in real world. One of t