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Test Report. No. CANEC1215784101 Date: 23 Nov 2012. Page 1 of 7.
SEMTECH ELECTRONICS LIMITED.
12-18 BAIYE CHENG ROAD,SHANGTUN INDUSTRIAL ZONE,LIAOBU,DONGGUAN,GUANGDONG,PR
CHINA.
.
The following sample(s) was/were submitted and identified on behalf of the clients as : DIP GLASS DIODE.
SGS Job No. : CP12-055229 - GZ.
Date of Sample Received :. 20 Nov 2012.
Testing Period :. 20 Nov 2012 - 23 Nov 2012.
Test Requested :. Selected test(s) as requested by client..
Test Method :. Please refer to next page(s)..
Test Results :. Please refer to next page(s)..
Conclusion :. Based on the performed tests on submitted samples, the results of Lead,
Mercury, Cadmium, Hexavalent chromium, Polybrominated biphenyls (PBB),
Polybrominated diphenyl ethers (PBDE) comply with the limits as set by RoHS
Directive 2011/65/EU Annex II; recasting 2002/95/EC..
Signed for and on behalf of
SGS-CSTC Ltd..
Almay Gao.
Approved Signatory.
0000329162
Test Report. No. CANEC1215784101 Date: 23 Nov 2012. Page 2 of 7.
Test Results :.
Test Part Description :.
Specimen No.. SGS Sample ID. Description.
1. CAN12-157841.001 Brown body w/ black printing.
2. CAN12-157841.002 Silvery metal pin.
Remarks :.
(1) 1 mg/kg = 1 ppm = 0.0001%.
(2) MDL = Method Detection Limit.
(3) ND = Not Detected ( MDL ).
(4) - = Not Regulated.
RoHS Directive 2011/65/EU.
Test Method :. With reference to IEC 62321:2008
(1) Determination of Cadmium by
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