单片机系统可靠性技术及发展（Reliability, technology and development of single chip microcomputer system）.docVIP

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单片机系统可靠性技术及发展（Reliability, technology and development of single chip microcomputer system）.doc

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单片机系统可靠性技术及发展（Reliability, technology and development of single chip microcomputer system）

单片机系统可靠性技术及发展（Reliability, technology and development of single chip microcomputer system） Reliability, technology and development of single chip microcomputer system (Shao Beibei) Motorola single chip microcomputer application development research center of Tsinghua University (100084) Beibei Shao Abstract: This paper introduces the efforts and developments of SCM technology in providing system reliability in recent years. To remind users how to select SCM, MCU application, system design and manufacturing process, so as to realize the high reliability MCU application system. Key words: single chip microcomputer, reliability, EMC With the rapid development of semiconductor technology, some new anti-interference techniques have been adopted in the design of single chip microcomputer to improve the reliability of single chip microcomputer. In addition to the choice of anti-interference ability of SCM, SCM system other auxiliary components of the reliability is also critical, some interference suppression components to help improve the reliability of the system. In addition, SCM system in circuit design, printed circuit board design, wiring and manufacturing processes, system installation, good grounding, etc., all directly affect the reliability of the application system. Anti interference measures of single chip microcomputer In order to improve the reliability of single chip microcomputer itself. In recent years, manufacturers of single chip microcomputer have adopted a series of measures in the design of single chip microcomputer in order to improve reliability. These technologies are mainly embodied in the following aspects. 1. reduce the external clock frequency The external clock is a high frequency noise source, in addition to causing interference to the application system, it may also cause interference to the outside world, so that electromagnetic compatibility testing can not reach the standard. In the application system which requires high system reliabilit