Improved bias equalization method for suppression temperature-induced errors in microbolometer FPA over 20 K substrate temperature change期刊.pdfVIP

Improved bias equalization method for suppression temperature-induced errors in microbolometer FPA over 20 K substrate temperature change Michael A. Demyanenko∗ Institute of Semiconductor Physics, Siberian Branch of Russian Academy of Sciences, 13, Lavrentiev Avenue, Novosibirsk, 630090, Russia