欧洲电子显微镜介绍课件，很好，很全面2_Lecture_jo_V4.pptVIP

* Wavelength of accelerated electrons Light ~500 nm Shortening of Electron Wavelength: High-Voltage Microscopy JEM-ARM1250 in Stuttgart Demonstration of 0.1 nm point resolution by diffractogram analysis Thin slab of bcc-Cu in a ?3 - 84? tilt grain boundary (F. Ernst) Dr. Fritz Phillipp, Max-Planck-Institut fuer Metallforschung, Stuttgart Split polepiece lens Glaser‘s Bell shaped field *