基于掉电数据存储的耐压绝缘测试系统设计-电子设计工程.pdfVIP

22 3 电子设计工程 第 卷 第 期 2014 年 2 月 Vol.22 No.3 Electronic Design Engineering Feb. 2014 基于掉电数据存储的耐压绝缘测试系统设计 可晓海，古丽江·库尔班，常莉丽，王 平，路 （伊犁师范学院 电子与信息工程学院，新疆 伊宁 835000） 摘要 应用非易失性存储芯片 24C16 与单片机相连接，设计了一种基于掉电数据存储的耐压绝缘测试系统，详细 ： 说明了掉电数据存储的耐压绝缘测试系统的设计思路和硬件电路结构，编写了相应的读写程序。这种串行非易失 性存储技术具有高速读写、百万次擦写寿命和数据保存时间长的优点，能极大提高系统的适用范围和系统的测试 效率。 关键词：耐压绝缘测试；24WC16 芯片；掉电数据存储；单片机 中图分类号：TP302 文献标识码：A 文章编号：1674-6236(2014)03-0124-05 Design of pressure insulation test system based on power-down data storage KE Xiao-hai, KUERBAN Gulijiang, CHANG Li-li, WANG Ping, LU Chong School of Electronic and Information Engineering YiLi Normal College, Yining 835000, China （ ） Abstract: Design a pressure insulation testing system based on power-down data storage which used the nonvolatile memory chips 24c16 power-fail data storage capabilities connected to the microcontroller in this paper. Designing idea and the circuit structure of the Design of pressure insulation test system based on power-down data storage was described in detail, and the write and read programs were complied. Because of this serial nonvolatile storage technology has much merits, such as high speed read and write, million times to wipe and storage for long time. These advantages can greatly enhance the application scope of system and the test efficiency of system. Key words: pressure insulation test; 24WC16 chips; power-down data storage; microcontroller 各 式 各 样 的 电 气 设 备、 家 用 电 器、 电 源 接 头 排 插 以 件