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Cascina, May 23, 2007 LSC-VIRGO Joint Meeting Presentation of a new Virgo groupINFN/University Genova Gianluca Gemme LIGO-G070336-00-Z Foreword In Genoa there is a wide and long-dating expertise in surface and material science both in the Physics Department and in INFN Several instruments are available for surface analysis and thin film characterization and growth (Ion sputtering, MBE), down to the monolayer limit It is possible to carry out, with high surface sensitivity, studies of structure, composition and chemical state of materials (XRD, STM, AFM, XPS/AES) The optical characterization of substrates and films is possible as well (spectroscopic ellipsometer) There are also solid competences in the controlled modification of materials, by means of heating, sputtering or ionic implantation XPS/AESspectrometer Proposed contributions Study and development of a method to assess the chemical composition of the pollution on the mirrors (on-site, whenever possible) Participation to the RD activities on Adv. Virgo, (WG3, Suspensions and thermal noise issues) analysis of the structure and optical properties of the reflecting coating on mirror samples with silicon and silica substrates chemical and morphological characterization of surfaces through XPS/AES and AFM measurements controlled structural modification of the coatings by ionic sputtering and ionic implantation Contributions (continued) Study and development of a technique for the neutralization of the residual charge on the mirror surface (if required) Participation to the commissioning and operation of the detector (also through the analysis of technical and scientific data) Participation to data taking shifts Group composition Several of the Genoa group members have at present responsibilities in other experiments; it is foreseen that their involvement will be positively modified over next few years: the FTE of all listed persons is relative solely to the first year of activity, and will be revised at