A thymine–adenine dinucleotide repeat polymorphism near IL28B is associated with spontaneous clearance of hepatitis C virus.pdfVIP
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A thymine–adenine dinucleotide repeat polymorphism near IL28B is associated with spontaneous clearance of hepatitis C virus
Chapter 3
Fault and Defect Modeling
A model of a physical object or model of a phenomenon is a representation of the object or
phenomenon that is used for the specific purpose of analyzing the behavior of the object, studying
the phenomenon, or studying the effect of the object or phenomenon on its environment or sur
roundings. A computer simulation program uses a model. The information we obtain from running
a simulation program depends on the model that is used for simulation. For example, a model of a
circuit can be developed for predicting its temperature radiation, its logical behavior, or its behavior
of when the circuit becomes faulty.
Just as the binary logic value system, containing 0 and 1, is used as a simplified model for
complex line values in digital systems, a simplified value system is needed to model faults on circuit
lines. Such a fault model should be simple and should be able to facilitate analysis of faulty behavior
of a digital system.
This chapter discusses fault models and issues that are related to fault analysis and simulation of
a circuit that is faulty. We try to set a solid background for the reader in understanding faults and
circuit fault models, as this background is crucial in understanding the materials in the rest of this
book. We discuss various fault models, ways of reducing faults for faster analysis, and simulation
issues for generating fault lists.
3.1 Fault Modeling
This chapter is on fault and defect modeling. Before we discuss various ways in which such model
ing can be done, we need to give a clear definition of various terms that are used in this regard.
As discussed in Chap. 1, a defect in an electronic system refers to a flaw in the actual hard
ware.
A fault , on the other hand, is a representation of a defect and is used in computer programs for
analyzing defects in electronic components.
An error i
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