X射线椭圆弯晶谱仪试验研究.pdfVIP

12 4 V ol. 12 N o. 4 2004 8 Opt ics and Pr ecision Eng ineering Aug. 2004 1004924X 2004) 0404 1505 X 1 1 1 1 1 2 肖沙里 , 唐跃林 , 熊先才 , 钟先信 , 高 洁 , 杨国洪 1. 重庆大学 光电技术及系统教育部重点 验室, 重庆400044; 2. 中国工程物理研究院激光聚变研究中心, 四川绵阳621900) : , 620~ 6200 eV X , KAP L iFP ET M iCa , 2d 0. 4~ 2 . 6 nmBragg 30~ 67. 5, 120 8 0 . 2 mm , 0 . 958 6, 1 350 mm , 1 4 56 mm , ! ∀#, 150 J, 0. 35 mm, 3 10- 3 Pa, 0. 63~ 0 . 79 nm , ∃ / ) 1/ 4 86 , , : 晶体谱仪; 激光等离子体; X 射线谱; 光谱分析 : O561 : A Experimentation of the Xray elliptical crystal spectrograph 1 1 1 1 1 2 XIAO Shali , T A N G Y uelin , XION G Xiancai , ZHONG X ianxin , GAO J ie , YA N G Guohong ( 1. The K ey L aboratory of Op ticelectronic Technology and System, M inistry of Education, Chong ing University , Chong ing 400044, China; 2. Research Center of L aser Fusion, China A cademy of Engineer ing Physics , M iany ang 621900, China) Abstract: Based on the t heory t hat is ray emitt ed f rom a focus f ront) of an ellipse w ill converge on t he ot h er focu s back) by t he reflect ion on t he ellipt ical surf ace, t he Ellipt ical Cryst al Spect rograph ECS) in t he Xray region of 620~ 6 200 eV w as designed. T he principle of the syst em w as analyzed , and t he design and manufacture w ere accomplished. KA P, L iF , PET and M iCa are u sed as dispersive element s covering Bragg ang le f rom 30 to 67. 5. T he crystal sizes are 120 8 0. 2 mm w it h the curved analyzer substrate of ec cent ricity = 0. 958 6, focal dist an