基于增强型扫描结构esffsed的老化加固2.pptxVIP

历史回顾一种基于时序拆借的抗老化BIST设计一种探测老化的自适应可配置时序单元对一种增强型扫描时序单元进行了功能复用，增加了检测老化的模式ReferencesKeith A. Bowman, James W. Tschanz, Nam Sung Kim, Energy-Efficient and Metastability-Immune Resilient Circuits for Dynamic Variation Tolerance[J]. IEEE Journal OF Solid-State Circuits, vol. 44, No. 1, January 2009：49-63 A. Goel, S. Bhunia, H. Mahmoodi, and K. Roy. Low-overhead design of soft-error-tolerant scan flip-flops with enhanced-scan capability [C] // Proceedings of Asia and South Pacific Conference on Design Automation,Yokohama, 2006:665-670Keith A. Bowman North Carolina State University and He is currently