基于fpga的c3仿真测试系统atp接入模块的研究与设计-电力电子与电力传动专业论文.docxVIP

基于fpga的c3仿真测试系统atp接入模块的研究与设计-电力电子与电力传动专业论文.docx

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基于fpga的c3仿真测试系统atp接入模块的研究与设计-电力电子与电力传动专业论文

基于 基于 FPGA 的 C3 仿真测试系统 ATP 接入模块的研究与设计 兰州 兰州交通大学硕士学位论文 万方数据 万方数据 万方数据 万方数据 Abstract The Chinese Train Control System (CTCS) is compiled by the railway sector, based on our current and future high-speed passenger traffic line development demand, combined with the basic national condition of China. In the CTCS vehicle subsystems, automatic train protection (ATP) is the core equipment, the on-board ATP in our high-speed trains, which are mainly imported from abroad, different manufacturers who provide different ATP equipment interfaces, and there are large differences between these interfaces; If ATP equipments broken down, there are only a few specialized skillful workers who can repair them; Research on the on-board ATP in our country is still in its infancy, testers are still using the traditional method of debugging on-board, which is not only wasting labor power, but also has limitation in testing the function of ATP equipments. It is quite urgent to have technological breakthroughs about ATP equipments by studying the interface function of ATP comprehensively in this stage. The ATP access module designed in this thesis is an important part of CTCS-3 (C3) simulation and test system. Using FPGA as the core components in data processing modules, driven by the physical interface to connect the on-board ATP; The interface application logic are designed suitable for the on-board ATP using the internal communication protocol, this module achieve the goal that ATP train interface and brake interface are accessed to C3 simulation and test system, significantly reduces the cost of the simulation test, and effectively formulate various test schemes to achieve the purpose of the simulation test. Firstly, based on the analysis of the theoretical basis of ATP, the overall design schemes about ATP access module are proposed combining with application environment of C3 simulation and test system, demonstrating the design principles and functional requirements about ATP access m

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