STREGA WP1M1 mirror substrates LIGOStrega wp1m1镜基板资料介绍.pptVIP

Temperature dependence of the mechanical dissipation in single layer tantalum pentoxide coatings on thin single-crystal silicon substrates. GEO I. Martin, S. Reid, D. Crooks, J. Hough, S. Rowan Univ. of Glasgow M.M. Fejer, R. Route Stanford University A. Remillieux, J.M. Mackowski, C. Comtet, N. Morgado L. Pinard, Ch. Michel LMA, Lyon G. Harry LIGO MIT H. Armandula, LIGO Caltech S. Penn, Hobart and William Smith Colleges Scientific motivation GEO Silicon is of interest as a mirror substrate material for future detectors – its mechanical loss is predicted to decrease at low temperatures Mechanical dissipation from dielectric mirror coatings is predicted to be a significant source of thermal noise for advanced detectors. (Coatings must also be of low optical loss.) Experiments suggest Ta2O5 is the dominant source of dissipation in current ion-beam-sputtered SiO2/Ta2O5 coatings Doping the Ta2O5 with TiO2 can reduce the mechanical dissipation Mechanism responsible for the observed mechanical loss in Ta2O5 as yet not clearly identified Experimental setup schematic of cryostat uncoated cantilever in situ coated cantilever in situ samples tantala coating electrostatic drive Silicon cantilever with coating The silicon samples have been fabricated by wet etching from silicon wafers at Stanford (Stefan Zappe) The coatings were deposited by LMA. Silicon substrate properties: ~ 92 mm thick, P-type Boron doped, resistivity = 10-20 W-cm tantala coating applied to bottom surface Tantala coating properties: 0.5 mm single layer tantala, doped with ?14.5 ± 1 % titania (Formula 5) coating clamping block 34mm 500mm 92mm Amplitude ring-down of uncoated silicon cantilever for the third bending mode at f~1.9 kHz at 120K Experimental procedure Resonant modes of samples excited using an electrostatic drive Sample displacement monitored using shadow sensor Measure rate of decay of the mode amplitudes, from which mechanical dissipation, f(w0), can be determined. Coated sili