量子进化算法在基于故障模拟的时序电路测试生成中的应用-测试计量技术及仪器专业论文.docxVIP

万方数据 万方数据 摘 要 量子进化算法在基于故障模拟的时序电路 测试生成中的应用 摘 要 数字电路的测试生成问题是长期以来制约集成电路发展的难题，找到有效的 数字电路测试生成方法具有非常重要的理论和现实意义。随着电路复杂性和集成 度的不断提高，数字电路的测试已成为妨碍 LSI/VLSI 付诸应用的瓶颈。尽管国 内外许多学者在数字电路测试生成上已做了大量的工作，时序电路的测试生成问 题仍然没有完全解决。本文采用基于故障模拟的方法，首次对量子进化算法 （QEA）在时序电路测试生成中的应用进行了探索。 本文将量子计算中的量子位和叠加态的概念引入传统的测试生成算法中，结 合时序电路的特点，建立了时序电路的量子进化算法测试生成模型。在国际标准 电路 iscas’89 上的仿真实验的结果表明，与基于 GA 的同类算法相比，该算法模 型可获得较高的故障覆盖率和较小的测试矢量集。 为了进一步改善测试生成结果，针对量子进化算法的特点，文中还提出改进 经典的量子更新算子和基于逻辑模拟的量子染色体初始值设置两项措施，对量子 进化算法的测试生成模型进行优化。优化后的量子进化算法模型上在国际标准电 路 iscas’89 上的实验结果证明了这两项措施的有效性。 关键词：量子进化算法， 自动测试生成， 时序电路，故障模拟 II 英文摘要 英文摘要 PAGE IV PAGE IV 万方数据 The Application of Quantum Inspired Evolutionary Algorithm in Fault Simulation Based ATPG of Sequential Circuits ABSTRACT The development of the integrated circuits has been restricted by the test pattern generation issue of digital circuits over a long period of time. So，finding effective methods in test pattern generation for digital circuits have great significance both theoretically and technically. With the development of digital integrated circuits, test technologies have become a bottleneck in the application of LSI/VLSI, because the development of test technologies can not catch up with that of digital integrated circuits. Although scholars from home and abroad have done lots of research work on the test pattern generation of digital circuits, it remains a generally acknowledged puzzle. By employing fault simulation based method, this paper is first to explore the application of quantum inspired evolutionary algorithm (QEA) in test pattern generation of sequential circuits. According to the characteristics of the sequencial circuits, concepts like qubit and superposition of quantum computation were introduced to traditional test pattern generation algorithm, to build a quantum-inspired evolution algorithm model for ATPG in this paper. Simulation experiments on iscas’89 benchmarks shows, compared to GA based similar algorithms, proposed algorithm model can generate test patterns