质谱技术在高科技产业上的角色.pptVIP

.tw/imgres?imgurl=http://www.condensed-matter.uni-tuebingen.de/resources/pictures/simsschema.jpgimgrefurl=http://www.condensed-matter.uni-tuebingen.de/cms/parser/parser.php%3Ffile%3D/en/facilities/sims.htmus Ion imaging Ion-images of the surface was recorded with a lateral resolution of up to 5μm. The primary ion beam is scanned over the surface and for every point the intensity of the chosen mass is recorded. The picture on the left shows an image of a metal surface. In the right corner of the window there was a SED - image of the sample. The width of this image is about 300μm. The right picture shows the titanium impurities of a natural SnO2 single crystal surface (110). The width of this picture is about 700μm .tw/imgres?imgurl=http://www.condensed-matter.uni-tuebingen.de/resources/pictures/simsschema.jpgimgrefurl=http://www.condensed-matter.uni-tuebingen.de/cms/parser/parser.php%3Ffile%3D/en/facilities/sims.htmus Inductively Coupled Plasma Time-of-Flight (TOF) Mass Spectrometer Staticic SIMS Depth profiling – Dynamic SIMS .tw/imgres?imgurl=http://www.condensed-matter.uni-tuebingen.de/resources/pictures/simsschema.jpgimgrefurl=http://www.condensed-matter.uni-tuebingen.de/cms/parser/parser.php%3Ffile%3D/en/facilities/sims.htmus Depth profile of a sample, the beam is scanned in a spiral and the counters are only open, when the beam reaches a central region of the sputter-crater. With this method it is possible to avoid edge effects and to get only a signal of a defined sputter-depth. Both profiles have been taken on the same sample (tinoxide coated silicium wafer), detecting positive (left) and negative (right) ions with a total depth of about 350nm MS Applications in Biotechnology: Genomics Proteomics Metabolomics Glycomics Lipidomics Interactomics Protein Biomarker identification The official NIH (USA) definition of a biomarker is: a characteristic that is objectively measured and evaluated as an indicator of normal biologic processes, pat