Total Ionizing Dose and Single-Event-Effects Test Report电离总剂量和单粒子效应试验报告.pdfVIP

Total Ionizing Dose and Single-Event-Effects Test Report S-Series DC-DC Converter Revision A July, 2003 Executive Summary of S-Series Radiation Test Results The S-Series converters were tested for TID (Total Ionizing Dose) and for Single Event Effects (SEE). TID A total of 5 devices each of different model types were tested at McClellan AFB near Sacramento California. Three of the units tested were single output versions and two of the units were dual output versions. Of the single output models the 3.3V, 5V and 15V output models were selected for testing. For the Dual versions, the 5V dual and 15V dual models were selected for testing. All S-Series models of different output voltages are of similar circuit configuration. Differences are magnetic turns ratios, output filtering component values, and compensation circuit values to accommodate the specific output. The outputs of the units were loaded with a resistive load equal to ½ of the rated maximum. The units were irradiated in a dose rate chamber containing 19,200 Curies of Co60. The chamber was set up to provide a dose rate of approximately 1k rad (SiO2)/min. A screw driven automatic cart was used to position the units relative to the source to obtain the desired dose rate. Tests were conducted in accordance with MIL-STD-883, Method 1019.5, condition B. After radiation exposure the parts were annealed at 100°C for 160 hours. SEE Single event testing was performed at Texas AM University in College Station, Texas. A total of three samples were evaluated. The samples selected were the 3.3V single, 15V single, and 15V dual. The units were biased at full load during irradiation. The parts were irradiated with xenon and gold ions producing LET levels of 47, 60 and 83 MeV⋅cm2 / mg. Conclusion The S-Series parts passed the irradiation tests. Although not all the S-Series output voltages were tested, the results should be considered applicable to the c