04-扫描近场光学显微镜.pptxVIP

04扫描近场光学显微镜Scanning Near-field Optical Microscopy (SNOM)近场扫描光学显微镜Near-field scanning optical microscopy (NSOM);本章内容;SNOM简介;发展历史;发展历史;Introduction The interaction of light with an object, such as a microscope specimen, results in the generation of both near-field and far-field light components. The far-field light propagates through space in an unconfined manner and is the normal light utilized in conventional microscopy. The near-field (or?evanescent) light consists of a nonpropagating field that exists near the surface of an object at distances less than a single wavelength of light. Light in the near-field carries more high-frequency information and has its greatest amplitude in the region within the first few tens of nanometers of the specimen surface. Because the near-field light decays exponentially within a distance less than the wavelength of the light, it usually goes undetected. In effect, as the light propagates away from the surface into the far-field region, the highest-frequency spatial information is filtered out, and the well known diffraction-based Abbe limit on resolution is imposed. By detecting and utilizing the near-field light before it undergoes diffraction, the NSOM makes available the full gamut of far-field optical contrast-enhancing mechanisms at much higher spatial resolution. In addition to non-diffraction-limited high-resolution optical imaging, near-field optical techniques can be applied to chemical and structural characterization through spectroscopic analysis at resolutions beneath 100 nanometers. The most recent commercial NSOM instruments combine the scanning force techniques of an AFM with the optical detection capabilities of conventional optical microscopy. The overall NSOM design can vary significantly, depending upon the requirements of the particular research project. One of the most common configurations is to incorporate the NSOM into an inverted fluorescence microscope. By basing the NSOM on a conventional optical inst