第7章:图形刻蚀技术
(Chapter 11)
?问题:
-常见的刻蚀对象:SiO2 Si3N4 Poly-Si磷 硅玻璃、铝或铝合金、衬底材料等
-即:金属刻蚀、介质刻蚀、硅(半导体)刻 蚀
Photoresist
Photoresist
mask
mask
Film
Protected film
Photoresist
mask
to be etched
Film to be etched
(b) Substrate after etch
(a) Photoresist-patterned substrate
Wet etching
Wet etching
Resist
Layer to be etched
SubsUate
Reactive Ion plasma sictiing (RlE)
I high pressure \^low pressure
图4-21不同腐蚀工艺的结果:〈左面}湿法腐蚀(髙各向同性〉、 C中间)干法刻曲方向性}和佑恥干法刻述(爲方向性)
T^perfEteh
SdeMallHxtile
WtEtdi
Isctn
ic
(c^endh^cnequipTErt
pEranrters)
Aisohrpic(dq^endungcnequipTErt ponjnrlers)
SliccnTtendi
Etch Bias、Undercut、S
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