简介及sfi电气参数测试.pptxVIP

;Agenda;Introduction of SFF-8431;Introduction of SFF-8431;Introduction of SFF-8431;Introduction of SFF-8431;Introduction of SFF-8431;Introduction of SFF-8431;Introduction of SFF-8431;SFF-8431 Standard Compliance Test of SFI;TEST METHODOLOGY AND MEASUREMENT HOST COMPLIANCE TEST A.1 Test point Host system transmitter and receiver compliance are defined by tests in which a Host Compliance Board is inserted in place of the SFP+ module. The compliance points are B.;A.2 Measurement setup;A.2 TEST EQUIPMENT;A.3 Host Transmitter Output Jitter and Eye Mask Specifications at B ;10GSFP+Cu DIRECT ATTACH CABLE Compliance Test ;SFF-8431 Standard Compliance Test of SFI;SFF-8431 Standard Compliance Test of SFI;Our Test Environment;Key features of Test Instruments DSA8200 Digital Serial Analyzer DC to 65 GHz optical bandwidth; DC to 70+ GHz electrical bandwidth, with up to 12.5 GHz triggering. Bandwidth is determined by the capabilities of the installed modules; CR125A Electrical Clock Recovery instrument 100 Mb/s to 12.5 Gb/s continuous data rate coverage; Single-ended or differential 50 Ω data inputs/outputs; DC coupled data through path; Insertion loss: -2.6dB when 12GHz 80E04 Electrical Sample Module;Installing Test Environment Cautions Do NOT apply a signal outside the Maximum Input Voltage Swing; Always use a wrist strap when making signal connections; Discharge to ground any electrostatic charge that may be present on the center and outer conductors of cables before attaching the cables to the instrument; Never install or remove modules while the instrument is powered on; Do NOT transport or ship the instrument with modules installed; If possible, always use ESD protection module(80E02) along the test path, example, TDR test ; Always disable the 80E04’s TDR function when not use the TDR function.;C.1 Acquainted with Our Instrument DSA8200 Digital Serial Analyzer;Eye Diagram Test by DSA8200;CR125A Electrical Clock Recovery instrument;80E04 Electr