现代材料分析方法-afm.pptVIP

原子力显微镜  Atomic Force Microscope (AFM);Introduction;原子力显微镜示意图;;测量原子间相互作用力;For practical AFM probe tip and the sample surface, attractive force between them could be much larger than what is described here for a tow-atoms system. This is because, at least, the size of the tip is much larger than an atom. Typical radius of a commercial tip is ~ 20 nm. Also, much longer-range forces could occur in practice.;Feature of AFM;Features of AFM: Creates topographical images with a height resolution of ~0.1 nm and lateral resolution down to ~5nm. Friction force images can distinguish different mat