dram内存颗粒测试简介.pptxVIP

会计学;Agenda;DRAM Manufacture;Why Testing?;IC Test Methodology;Basic Test Signal;Typical DRAM Final Test Flow;DRAM Burn-in (MBT);DRAM Burn-in (TBT);DRAM Advantest Test;DC Test ;DC Test – Open Short;DC Test – Open Short;DC Test – Open Short;DC Test – Open Short;DC Test – Leakage;DC Test – Leakage;DC Test – Leakage;DC Test – Input Leakage Low;DC Test – Input Leakage High;DC Test – Output Leakage Low;DC Test – Output Leakage High;DC Test – Test Program Condition;DC Test – IDD;DC Test – Static IDD;DC Test – Dynamic IDD;Function Test;0;DRAM Test – March Pattern;DRAM Test – Failure Mode;DRAM Test – Ma