半导体质量和可靠性手册-来自日本东芝的内部资料.pdf

ReliabilityHandbook

Ver.2

December2018

©2017-2018ToshibaElectronicDevicesStorageCorporation

TableofContents

Chapter1SemiconductorReliability

1-1.ReliabilityConcept…10

1-1-1.DefiningandQuantifyingReliability…10

1-1-2.ReliabilityandTime11

1-1-2-1.Reliability(orReliabilityFunction)R(t)

1-1-2-2.Non-Reliability(orCumulativeFailureDistribution)F(t)

1-1-2-3.FailureDensityFunctionƒ(t)

1-1-2-4.(Instantaneous)FailureRate(orHazardRate)(t)

1-1-2-5.ProductLife

1-1-2-6.Distr