InternationalJournalofResearchPublicationandReviews,Vol6,Issue4,pp2283-2298April2025
InternationalJournalofResearchPublicationandReviews
Journalhomepage:ISSN2582-7421
RootCauseAnalysisofDowntimeinPlasmaEtchingEquipment
throughFailureModeMapping.
NdokwuTochukwuAnthony
DepartmentofEngineeringTechnologyandIndustrialDistribution,TexasAMUniversity,CollegeStation,USA
DOI:/10.55248/gengpi.6.0425.1385
ABSTRACT
Intherealmofsemiconductormanufacturing,plasmaetchingequ
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