AST英文资料.docVIP

1.0 INTRODUCTION 1.1 Purpose This document is the worldwide test and reliability standard used to specify accelerated stress testing (AST) of electrical and electronic products. 1.2 Overview Background information, methodology, responsibilities, and detailed procedures for AST are contained in this document. AST consists of highly accelerated life test (HALT), screen verification, proof-of-screen (POS), and highly accelerated stress screening (HASS). 1.3 Definitions Acronyms AST = accelerated stress testing HALT = highly accelerated life test HASS = highly accelerated stress screening POS = proof-of-screen UOTL = upper operating temperature limit LOTL = lower operating temperature limit UDTL = upper destruction temperature limit LDTL = lower destruction temperature limit OVL = operating vibration limit DVL = destruction vibration limit 2.0 BACKGROUND 2.1 Purpose The purpose of AST is to precipitate and detect (observe) defects in products during design and detect defects during manufacturing. Relevant defects, or those likely to occur in deployment, must have the root cause identified and the optimal solution must be determined, implemented, and verified. Section 4.3 contains more information on relevant defects. 2.2 Methodology During AST, applied stresses will be increased above expected deployment levels to compensate for a relatively small sample size and to find defects quickly. AST simulates the decrease in product strength over time (cumulative fatigue damage) or an absolute overstress condition. AST uses a “test-to-failure” methodology during product design and a “screening” process during manufacturing. These are defined in more detail in sections 4 to 6 of this document. The accelerated stress test methods for electronics and electrical products include: 1. HALT (or product ruggedization) 2. Screen verification and POS (preparation for HASS), 3. HASS These methods can also be applied to some electromechanical products. 3.0 RESPONSIBILITIES 3.1 Reli