tofd 检测中采取二次波评定近扫查面缺陷尺寸的方法.pdfVIP

中国工业检验检测网 QQ:596705349 试验研究 TOFD 检测中采用二次波评定近扫查面 缺陷尺寸的方法 孙忠波 ,齐向前 ,张 　平 (天津诚信达金属检测技术有限公司 ,天津 　300384) 摘 　要 :在 TO FD 检测过程中 ,因直通波宽度而产生的近扫查面盲区对检测影响很大 。为精 确定量位于近扫查面盲区的缺陷 ,制作了人工缺陷试块 ,对其采用常规 TO FD 以及 TO FD 二次波 分别进行扫查 。对比两种扫查方式所得 TO FD 图像可见 ,常规 TO FD 技术对近扫查面缺陷极易漏 检且无法定量 ,而利用 TO FD 二次波扫查方式得到的图像能够显著分辨出缺陷并能精确定量 , 因 此可弥补常规 TO FD 检测中对近扫查面缺陷检出能力的不足 。 关键词 :超声波衍射时差技术 ;近扫查面盲区;直通波 ;二次波扫查 　　中图分类号 : T G115 . 28 　　　文献标志码 :A 　　　文章编号 (2009) An Evaluation Method f or Near Inspection Surface Defect Tested by the TOFD Secondary Wave 中 国 SUN ZhongBo , QI XiangQian , ZHANG Ping 工( Tianj in Cheng Xinda Met al Testing Technolo gy Co L TD , Tianj in 300384 , China) 业 检 Abstract : The dead zone of in sp ection surface could not be avoided when u sing TO FD t echnique due to t he 验 widt h of lat eral wave . In order to solve t he p roblem , t he block wit h given dep t h of artificial defect , which were 检 resp ectively in sp ect ed by t raditional and secondary wave TO FD t echnique . The result , comp ared wit h t he different 测 images , wa s t hat t he defect near t he in sp ection surface was har d to be quantified a s well a s det ect ed by t he former of 网 two TO FD met hods. However , t he defect could be obviou sly reco gnized and accurat ely mea sured by t he latt er met hod . So t he t raditional TO FD in sp ection accomp anied wit h secondary wave TO FD was t he bett er way to avoid t he dead zone near t