8%2f20us波形冲击下MOV劣化过程中电容量变化地研究.pdfVIP

8/20us 波形冲击下MOV 劣化过程中电容量变化的 研究∗ 1 １ １ １ １ ２ 陈琳 傅金安 陈毅芬 杨超 吴健 孙涌 1 （厦门市避雷监测技术中心 厦门361012 2 北京雷电防护装置测试中心 北京 100176) 摘要：由于目前MOV型SPD劣化检测参数U 和I 不能对MOV劣化程度做出及时有效的判断，因此，研究一种能够考 1mA leakage 量MOV劣化程度的方法尤其重要。根据影响MOV电容的主要因素以及晶界肖恩特基势垒变化、离子迁移理论等氧化锌压 敏电阻的劣化机理，提出了氧化锌压敏电阻劣化过程中必然伴随电容量的变化。通过实验证明，MOV劣化时电容量的变化 与劣化程度具有近似线性的相关性。提出了电容量增幅具有考量MOV劣化程度的重要意义，同时证明：结合U1mA、Ileakage 和电容量3个参数变化能够更好的分析MOV内部劣化原因。 关键词：氧化锌压敏电阻；晶界；劣化；电容；漏电流；压敏电压； Study on capacitance change during the degradation of ZnO varistor Abstract: On account of it is unble to estimate the degradation degree of MOV timely and efficient by U1mA and Ileakage which are the detection parameters of MOV-model SPD in the current, for this reason, it is critical inportance for a new method that it is able to estimate the degradation degree of MOV. In the process of the degradation of ZnO varistors, it is necessarily companied by capacitance change, according to the major factors of influence on MOV capacitance and the reasons of the degradation of ZnO varistors, such as Schottky barrier change of the grain boundary and the thoery of ion migration, etc. It has been proven by experiments that there exists approximate linear correlation between the capacitance change and the degradation degree in the process of degradation of MOV. The significance of the capacitance growth could estimate the degradation degree of MOV. And the better analysis on the reasons of the degradation of MOV, based on the combination of the three parameters,U1mA、Ileakage and capacitance has been proven. Key words ：ZnO varistor ；grain boundary ；degradation ；capacitance ；leakage current ；U1mA； 0 引言 氧化锌压敏电阻器已广泛应用于过电压保护，浪涌吸收，过电流泄放等方面，是防护电气电子设备 因受雷电闪击及其他瞬态电磁干扰造