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2015-09-25 发布于重庆
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Extrinsic Size Effect in Piezoresponse Force Microscopy of Thin Films.pdf

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Extrinsic Size Effect in Piezoresponse Force Microscopy of Thin Films

To be submitted to Phys. Rev. B-Rapid Communications Extrinsic Size Effect in Piezoresponse Force Microscopy of Thin Films Anna N. Morozovska,1 1 *,2 †,3 Sergei V. Svechnikov, Eugene A. Eliseev, and Sergei V. Kalinin 1Institute of Semiconductor Physics, National Academy of Science of Ukraine, 45, pr. Nauki, 03028 Kiev, Ukraine 2Institute for Problems of Materials Science, National Academy of Science of Ukraine, 3, Krjijanovskogo, 03142 Kiev, Ukraine 3Materials Science and Technology Division and Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831 The extrinsic size effect in Piezoresponse Force Microscopy of ferroelectric and piezoelectric thin films on non-polar dielectric substrate is analyzed. Analytical expressions for effective piezoresponse, object transfer function components, and Rayleigh two-point resolution are obtained. These results can be broadly applied for effective piezoelectric response calculations in thin piezoelectric and ferroelectric films as well as surface polar layers e.g. in organic materials and bio-polymers. In particular, the effective piezoresponse * Corresponding author, eliseev@.ua † Corresponding author, sergei2@ 1 strongly decreases with film thickness whereas the sharpness of domain stripes image increases due to the object transfer function spectrum broadening. PACS: 77.80.Fm, 77.65.-j, 68.37.-d 2 Piezoelectric and dielectric properties of thin films, including