X射线小角散射法测量纳米粉末的粒度分布王辉.pdfVIP

22 1 Vol.22, No.1 2004 2 　　　　　　　　　　　　　 owder Metallurgy Technology　　　　　　　　　　　　　 Feb.2004 X ＊ 王 辉 　曾美琴 (, 　510640 ) 　:　X ZnO 、ZrO 、Fe Al O 2 2 3 。 X , T EM 。 X 。 K ratky , , , 。 1 ～ 300nm 。 :　X ;; Determination of particle size distribution of nanometer-sized powder by small angle X-ray scattering method Wang Hui, Zeng Meiqin (Co llege of M echan cal Eng neer ng, South Ch na Un vers ty of T echnolog y, G uang zhou 510640, Ch na) Abstract:Part cle s ze d str but ons of nanometer-s zed Z nO, Z rO , Fe, Al O pow ders had been determ ned by 2 2 3 small angle X-ray scatter ng method (SA XS)w th a common h gh-resolut on X-ray d ffractometer (Ph l ps X Pert M PD), the results obta ned w ere co ns stent w th those determ ned by the spec al SA XS d ffractometer and also w ere par t ally ver f ed by T EM observ at o n, w h ch nd cates that SAXS method u s ng the common h gh-resolut on d ffrac- tometer s appl cable to measure the part cle s ze d str but on of nanometer-s zed pow der.Th s method needs no ex- pens ve SAXS dev ce and can be more eas ly operated than that u s ng the spec al SAXS d ffractome ter equ pped w th four sl ts system or K ratky coll mat on sy stem.So f ar the nano meter-s zed pow der w th the part cle s ze less than 300 nm can be measured. Key words:small angle X-ray scatter ng;nanometer-s zed pow der;par t cle s ze d str but on 1　 , 、 , 。 , 。 X (SAXS ) , , 、 ,