《Simulating and modeling the breakdown voltage in a semi-insulating GaAs P+N junction diode》.pdf

《Simulating and modeling the breakdown voltage in a semi-insulating GaAs P+N junction diode》.pdf

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《Simulating and modeling the breakdown voltage in a semi-insulating GaAs P+N junction diode》.pdf

Vo1.35,No.8 JournalofSemiconductors AUClust2014 Simulatingandmodelingthebreakdownvoltagein a semi-insulatingGaAsP+N junctiondiode A.ResfatBrahimi.R.Menezla,andM .Benchhima , LaboratoryofModelingandConceptionoftheCircuitsElectronic,DepartmentofElectronics,UniversityDjillaliLiabbs,BP89 SidiBelAbbes22000,Algeria Abstract:ThisworkaimstodeterminethecharacteristicI(breakdownvoltage)oftheinversecurrentinaGaAs PNiunctiondiode,subjecttoareversepolarization,whilespecifyingtheparametersthatinfluencethebreakdown voltageofthediode.Inthiswork wesimulatedthebehavioroftheionizationphenomenonbyimpactbreakdown byavalancheofthePNiunctions,subjecttoaninversepolarization. Welwilltakeintoaccountboththetrappingmode1inastationaryregimeintheP十N structureusinglikematerial ofbasistheIII—V compoundsandmainlytheGaAssemi—insulating inwhichthedeepcentershaveinimportant densities.Wearetalkingaboutthemodeloftrappinginthespacechargeregion(SCR)andthatisthetrapdensity donorandacceptorstates. Thecarriercrossingthespacechargeregion(SCR)ofW thicknesscreatesN electron-holepairs:forevery createdpair,theelectronandtheholearesweptquicklybytheelectricfield,eachinanoppositedirection,which comesback,accordingtoanalreadyacceptedreasoning,tothecrossingofthespacechargeregion(scR)byan electronorahole.SotheevenN paircreatedbytheinitia1particleprovokeN2ionizationsandsoforth. Thestudyofthephysicalandelectricalbehaviourofsemiconductorsisbasedontheinfluenceofthepresenceof deepcentersonthecharacteristicJ(1current—tension,whichrequiresthecalculationoftheelectrostaticpotential, theelectricfield,theintegralofionization,theden

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