基于测点必要度的模拟电路测点优选方法.pdfVIP

绗?6 鍗 绗?2 鏈 鎺 鍒 涓 鍐 绛 2011 骞 12 鏈 Vol. 26 No. 12 Control and Decision Dec. 2011 鏂囩珷缂栧彿: 1001-0920 (2011) 12-1895-05 鍩轰簬娴嬬偣蹇呰搴︾殑妯℃嫙鐢佃矾娴嬬偣浼橀€夋柟娉 榛勪互閿? 鏅 鍗? 鍛ㄥ畯浜 (绌哄啗宸ョ▼澶у宸ョ▼瀛﹂櫌锛岃タ瀹?10038) 鎽 瑕? 閽堝妯℃嫙鐢佃矾鐨勬祴鐐归€夋嫨闂, 鏍规嵁娴嬬偣鐨勫繀瑕佺▼搴? 鎻愬嚭浜嗏€滄祴鐐瑰繀瑕佸害鈥濈殑姒傚康, 鍚屾椂缁撳悎鈥滄晠闅滈殧绂 搴︹€濈殑姒傚康, 寤虹珛浜嗘柊鐨勬祴鐐逛紭閫夋柟娉? 缁欏嚭浜嗘柊绠楁硶鐨勮缁嗚绠楄繃绋嬪拰搴旂敤瀹炰緥. 瀹為獙鍒嗘瀽缁撴灉琛ㄦ槑, 鏂扮畻娉曠殑璁 绠楁晥鏋滀紭浜庣喌绠楁硶鍜屽熀浜庢晠闅滈殧绂诲害鐨勬祴鐐归€夋嫨绠楁硶, 鍙敤浜庡鏉傛ā鎷熺數璺殑娴嬬偣閫夋嫨. 鍏抽敭璇岤 妯℃嫙鐢佃矾锛涙晠闅滆瘖鏂紱鏁呴殰瀛楀吀锛涙祴鐐归€夋嫨 涓浘鍒嗙被鍙耳 TP306 鏂囩尞鏍囪瘑鐮? A Test point selection method for analog circuits based on essential degree HUANG Yi-feng, JING Bo, ZHOU Hong-liang (Engineering College锛孉ir Force Engineering University 锛孹i鈥檃n 710038 锛孋hina 锛嶤orrespondent 锛欻UANG Yi-feng, E-mail 锛歨uangyiff@126.com) Abstract: The problem of selecting the optimum test points of analog circuits is considered. The test point essential degree is proposed to identify how the test point is needed. Then combined with fault isolation degree, a new test point selection method is presented. The detailed calculating process of the new algorithm is given and two examples are proposed. The experiment results show that the new algorithm is better than entropy algorithm and the algorithm based on fault isolation degree, and can be applied to test point selection for complicated analog circuits. Key words: analog circuit 锛沠ault diagnosis 锛沠ault dictionary 锛泃est point selection 1 寮曞紩寮 瑷€瑷€瑷€ 鏈枃瀵瑰悇涓晠闅滃鐨勫彲闅旂娴嬬偣闆嗚繘琛屼簡鍒嗘瀽, 鐢变簬妯℃嫙鐢佃矾鐨勮緭鍏ユ縺鍔卞拰杈撳嚭鍝嶅簲鏄繛缁噺, 鎻愬嚭浜嗏€滄祴鐐瑰繀瑕佸害鈥濈殑姒傚康, 鍚屾椂缁撳悎鈥滄晠闅滈殧绂 鍏冧欢鍙傛暟瀛樺湪瀹瑰樊銆佺數璺腑瀛樺湪闈炵嚎鎬х幇璞″拰鍙嶉鍥 搴︹€濈殑姒傚康, 鎻愬嚭浜嗗熀浜庢祴鐐瑰繀瑕佸害鐨勬祴鐐逛紭閫夋柟娉? 璺€佹晠闅滄ā鍨嬫瘮杈冨鏉傜瓑鍥犵礌, 妯℃嫙鐢佃矾鐨勬晠闅滆瘖鏂 璇ユ柟娉曠患鍚堣€冭檻鍚勪釜娴嬬偣鐨勫繀瑕