ChemistryTheStudyofChange.pptVIP

* Chapter 4 Methods for Structural and Chemical Characterization 特性 of Nanomaterials Part II Principles and Methods Important physical-chemical properties of nanoparticles: Particle size Charge Structure Shape Chemical composition Principles of Light-Material Interactions Atomic Force Microscopy and Scanning Tunnel Microscopy Light is part of the electromagnetic radiation, including UV, infrared, x-ray, etc. Dual properties of light Wave property: wavelength, frequency Particle property: the photon 光子 whose energy is proportional to the frequency Energy, E hv, where h Plank’s constant and v frequency Refer to Figure 4.1 in textbook 频率 Light Microscopy 反射线 折射线 Electron microscopy No interaction between light and matter if light is transmitted through the material without change in frequency and direction. If light changes in direction only but no change in frequency. The method is called X-ray diffraction X射线衍射 XRD or small angle x-ray scattering X射线小角散射 SAXS . If the light frequency is changed, which means the materials have absorbed some of the light energy. The techniques which measure the light with changed frequency are called X-ray absorption spectroscopy X射线吸收光谱 XAS , Raman 拉曼光谱, Fourier transform infrared spectroscopy傅里叶变换红外光谱 FTIR , and nuclear magnetic resonance核磁共振 NMR imaging. X-ray diffraction X射线衍射 XRD X-ray diffraction X射线衍射 XRD Small angle x-ray scattering X射线小角散射 SAXS X-ray absorption spectroscopy X射线吸收光谱 XAS Fourier transform infrared spectroscopy傅里叶变换红外光谱 FTIR Nuclear magnetic resonance核磁共振 NMR 4. The excited matter can relax through several processes causing emission of fluorescent photons or electrons having different frequencies. Examples of characterization techniques utilizing these measurement principles are X-ray fluorescence spectroscopy X射线荧光光谱仪 XRF , luminescence spectroscopy 发光光谱学, energy loss spectroscopy 电子能量损失谱 ELS , and X-ray photoelectron spectroscopy X射线光电子能谱 XPS . X-ray fluorescence spect