信息检索方法方法.docVIP

外文及特种文献检索 1．出版物（Publication）检索???? （1）利用Springer-Link检索关于Electronic Testing的出版物中有关digital circuit design的论文（列举两篇相关文献）。利用Springer-Link检索关于Electronic Testing的出版物中有关digital circuit design的论文（列举两篇相关文献）。Journal of Electronic Testing digital circuit design 选择工具：数据库 Springer-Link 1、根据课题名称及所给检索词，Journal of Electronic Testing digital circuit design 2、数据库为Springer-Link 3、现在搜索框搜索Journal of Electronic Testing，在搜索结果中Browse Volumes Issues后输入digital circuit design。 4、搜索结果如下，选两篇。 Journal of Electronic Testing October 2004, Volume 20, Issue 5, pp 523-531 A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICs S. Matakias, Y. Tsiatouhas, A. Arapoyanni, Th. Haniotakis Abstract In this paper a new circuit for concurrent soft and timing error detection in CMOS ICs is presented. The circuit is based on current mode sense amplifier topologies to provide fast error detection times. After an error has been detected it can be corrected by using a retry cycle Title A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS Ics Journal ? Journal of Electronic Testing ? Volume 20, Issue 5 , pp 523-531 Publisher Kluwer Academic Publishers Title A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICs Journal ? Journal of Electronic Testing ? Volume 20, Issue 5 , pp 523-531 Cover Date 2004-10-01 DOI 10.1023/B:JETT.0000042516.12841.36 Print ISSN 0923-8174 Online ISSN 1573-0727 Publisher Kluwer Academic Publishers Additional Links ? Register for Journal Updates ? Editorial Board ? About This Journal ? Manuscript Submission Topics ? Computer-Aided Engineering (CAD, CAE) and Design ? Electronic and Computer Engineering ? Circuits and Systems Keywords concurrent testing soft and timing errors monitoring circuits time redundancy Authors S. Matakias (1) Y. Tsiatouhas (2) A. Arapoyanni (1) Th. Haniotakis (2) Author Affiliations 1. Department of Informatics Telecom., University of Athens, Panepi