Analytical current noise model based on nanoscale MOSFET.docVIP

Analytical current noise model based on nanoscale MOSFET.doc

  1. 1、本文档共6页,可阅读全部内容。
  2. 2、原创力文档(book118)网站文档一经付费(服务费),不意味着购买了该文档的版权,仅供个人/单位学习、研究之用,不得用于商业用途,未经授权,严禁复制、发行、汇编、翻译或者网络传播等,侵权必究。
  3. 3、本站所有内容均由合作方或网友上传,本站不对文档的完整性、权威性及其观点立场正确性做任何保证或承诺!文档内容仅供研究参考,付费前请自行鉴别。如您付费,意味着您自己接受本站规则且自行承担风险,本站不退款、不进行额外附加服务;查看《如何避免下载的几个坑》。如果您已付费下载过本站文档,您可以点击 这里二次下载
  4. 4、如文档侵犯商业秘密、侵犯著作权、侵犯人身权等,请点击“版权申诉”(推荐),也可以打举报电话:400-050-0827(电话支持时间:9:00-18:30)。
  5. 5、该文档为VIP文档,如果想要下载,成为VIP会员后,下载免费。
  6. 6、成为VIP后,下载本文档将扣除1次下载权益。下载后,不支持退款、换文档。如有疑问请联系我们
  7. 7、成为VIP后,您将拥有八大权益,权益包括:VIP文档下载权益、阅读免打扰、文档格式转换、高级专利检索、专属身份标志、高级客服、多端互通、版权登记。
  8. 8、VIP文档为合作方或网友上传,每下载1次, 网站将根据用户上传文档的质量评分、类型等,对文档贡献者给予高额补贴、流量扶持。如果你也想贡献VIP文档。上传文档
查看更多
Analytical current noise model based on nanoscale MOSFET.doc

Analytical current noise model based on nanoscale MOSFET   Abstract. In this paper, a physical understanding of excess noise component associated with transport mechanism in nanoscale MOSFET is developed. Based on the current flow image, current noise models valid for both uncorrelated and correlated carrier injection are derived. The variation of suppression-factors with source-drain voltage, gate voltage, temperature and source-drain doping are investigated. The results we obtained with considering the combination of the two effects are consistent with those from experiments and the theoretically explain is given.   Key words: Nanoscale MOSFETs, Current Noise, Fano.   While the drain thermal noise of long channel MOSFET agrees with the van der Ziel model[1], considerably larger excess noise has been observed in MOSFET with channel lengths of deep sub-micron which severely hinder the applications of RF CMOS. Since the channel length of MOSFET continues to downscaling, it becomes an urgent need to address the issue of noise reduction. A clear understanding and accurate prediction of this excess noise play an integral role in realization of optimal noise behavior.   However, it is still an argument about the component of excess noise. Many researchers have pointed out that short channel effects[2-6] such as the hot electron effect, channel length modulation (CLM), carrier heating and velocity saturation (mobility degradation) would lead to excess noise. Together with experimental measurements, they developed all kinds of analytical thermal noise correctional models based on the above short channel effects. Although the thermal noise correctional models can well describe the noise characteristic for deep submicron MOSFET, they are not valid for nanoscale MOSFET[7]. Some researchers attribute the failure of the thermal noise correctional models to the presence of shot noise[8,9]. Recent experiments, numerical simulations and theoretical results have proved the

您可能关注的文档

文档评论(0)

guan_son + 关注
实名认证
文档贡献者

该用户很懒,什么也没介绍

1亿VIP精品文档

相关文档